Nano-Science Center – Københavns Universitet

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Erhvervssamarbejde > Brug KU's faciliteter > Udstyr liste > Nano-Science Center

11. juni 2013

Nano-Science Center

Nano-Science Center har en stor mængde avanceret udstyr og instrumenter, som kan være til gavn for udvikling af produkter og processer i industrien. Nedenfor ses en oversigt over de instrumenter og services, som forskere ved Nano-Science Center har adgang til og i forskelligt omfang stiller til rådighed for industrien og andre forskere. Det sker både via samarbejder og i forbindelse med konsulentydelser. Kontakt den enkelte forsker for mere information.

Tekniske specifikationer

  • X-ray photoelectron spectroscopy (XPS), Kratos Axis Ultra instrument: Chemical composition of the surface (10 nm depth) of a sample (Nico Bovet)
  • Low energy electron diffraction (LEED): 2D surface structure of flat sample (Nico Bovet)
  • Quartz Crystal Microbalance with Dissipation QCM-D
  • Spectroscopic ellipsometry
  • X-ray reflectometer
  • Wide field microscope (Olympus) with Metal-halide lamp as excitation source (Tom Vosch)
  • Stage scanning fluorescence confocal microscope (Olympus) (Tom Vosch)
  • Stage scanning Raman microscope (Olympus) (Tom Vosch)
  • Time-correlated single photon counting (Becker-Hickl SPC830) (Tom Vosch)
  • Laser Excitation wavelengths (nm): 375, 458, 470, 488, 496, 514, 543, 561, 633, 690-960 tunable (Tom Vosch)
  • Rotating disk electrode and other electrochemical setups
  • PeakForce Quantum Mechanical Atomic Force Microscopy (QNM-AFM)
  • Decoder instrument for encoded beads (Morten Meldal)
  • Three laser beadsorter (Morten Meldal)
  • SPS Leica, Confocal Fluoresent Microscope (Dimitris Stamou)
  • TIRF Leica, Fluoresent Microscope (Dimitris Stamou)
  • ALV Goniometer, DLS (Dimitris Stamou)
  • Mass spectrometer coupled to electrochemical cell (DEMS)
  • FTIR with ATR cell (electrochemical and non electrochemical measurements possible)
  • BET: Surface area analysis. (Denis Okhrimenko)
  • Atomic force microscopy and spectroscopy: Particles physical properties such as topography, elasticity, hydrophobicity, conductivity and adhesion (Tue Hassenkam)
  • Scanning Electron Microscopy/Focused Ion Beam – combined with Energy Dispersive X-ray: Particle morphology, size, chemical composition, preparation of nanometer thick slices for TEM and creation of 3D tomograms of thin sections (Kim Dalby)
  • X-ray Diffraction: Solid identification and crystal structure study (Henning Osholm Sørensen)
  • Zeta - Streaming Potential: Particle surface charge (Denis Okhrimenko)

Målgruppe
Tilgængeligt for alle efter nærmere aftale.

Yderligere information
Se Nano-Science centerets hjemmeside for mere information.